Volume 39 Issue 3
Mar.  2014
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Wang Songjie, Wang Lu, Fu Jianmin, Ding Yue, 2014. A New Perspective for Research of Dabie-Sulu Ultrahigh-Pressure Metamorphic Rocks: Application of Optical Microscope-Based Cathodoluminescence. Earth Science, 39(3): 357-367. doi: 10.3799/dqkx.2014.034
Citation: Wang Songjie, Wang Lu, Fu Jianmin, Ding Yue, 2014. A New Perspective for Research of Dabie-Sulu Ultrahigh-Pressure Metamorphic Rocks: Application of Optical Microscope-Based Cathodoluminescence. Earth Science, 39(3): 357-367. doi: 10.3799/dqkx.2014.034

A New Perspective for Research of Dabie-Sulu Ultrahigh-Pressure Metamorphic Rocks: Application of Optical Microscope-Based Cathodoluminescence

doi: 10.3799/dqkx.2014.034
  • Received Date: 2013-08-21
  • Publish Date: 2014-03-15
  • With the use of optical microscope-based cathodoluminescence (OM-CL), many kinds of growth textures of minerals can be observed, which are either indiscernable or to be omitted easily with other routine analytical methods. OM-CL is an effective pre-research technique prior to other follow-up component analysis, which can provide important information for reconstructing formation and evolution processes of minerals. This technique has wide-spread applications in international petromineralogy, oil and gas reservoir and mineral deposits, but is relatively weak in metamorphic rocks. The applications of OM-CL in the UHP (ultra high power) metamorphic rocks are reviewed in this paper, as well as preliminary studies by OM-CL on ultrahigh-pressure eclogites, micaschist and marble at classical areas in the Dabie-Sulu UHP metamorphic belt. And its application and prospect in the fast identification of multi-phase tiny mineral facies and internal structural characterization, including growth zoning, distribution of trace elements, twinning and exsolution texture are discussed. A new perspective for our research on ultrahigh-pressure metamorphic rocks can be developed when combining OM-CL with mineral chemistry analysis techniques such as Roman spectrum, scanning electron microscope (SEM) and electron probe micro-analyzer (EPMA).

     

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